Profile picture for user lapouge
Bureau
S1.9
Date d'arrivée
Equipe de recherche

Research thematics

  • Metals
  • Architecturation of metals with laser
  • Experimental development

Past research thematics

  • Metals under irradiation
  • Deformation mechanism at micro/nanoscale (MEMS)

Articles

P. Lapouge, F. Onimus, R. Vayrette, J.-P. Raskin, T. Pardoen, and Y. Bréchet, “A novel on chip test method to characterize the creep behavior of metallic layers under heavy ion irradiation,” J. Nucl. Mater., vol. 476, pp. 20–29, Aug. 2016.

P. Lapouge, F. Onimus, M. Coulombier, J.-P. Raskin, T. Pardoen, and Y. Bréchet, “Creep behavior of submicron copper films under irradiation,” Acta Mater., vol. 131, pp. 77–87, Jun. 2017.